Incorporation probabilities and depth distributions of aluminum co-evaporated during Si(100) molecular beam epitaxy
M.-A. Hasan, J.-E. Sundgren, G.V. Hansson, L.C. Markert, J.E. GreeneVolume:
184
Year:
1990
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(90)90398-w
File:
PDF, 384 KB
english, 1990