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The p-n diode as a diagnostic tool for silicon molecular beam epitaxy
D.W. Smith, R.F. Houghton, E.H.C. Parker, T.E. WhallVolume:
184
Year:
1990
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(90)90412-7
File:
PDF, 315 KB
english, 1990