Surface oxidation effects on the electrical resistance of cermet thin films: X-ray photoelectron spectroscopy and Rutherford backscattering studies
A.D. Katnani, L.J. Matienzo, F. EmmiVolume:
204
Year:
1991
Language:
english
Pages:
10
DOI:
10.1016/0040-6090(91)90068-9
File:
PDF, 438 KB
english, 1991