Determination of layered synthetic microstructure...

Thin Solid Films 1991 Vol. 203; Iss. 2

Determination of layered synthetic microstructure parameters

A.D. Akhsakhalyan, A.A. Fraerman, N.I. Polushkin, Yu.Ya. Platonov, N.N. Salashchenko
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Volume:
203
Year:
1991
Language:
english
Pages:
10
DOI:
10.1016/0040-6090(91)90139-o
File:
PDF, 444 KB
english, 1991
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