Real-time study of migration in aluminum films by means of...

Real-time study of migration in aluminum films by means of subÅngström-sensitive scattering and profiling methods

Lars Mattsson, Yves-Henri Le Page, Fredric Ericson
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Volume:
198
Year:
1991
Language:
english
Pages:
8
DOI:
10.1016/0040-6090(91)90333-s
File:
PDF, 452 KB
english, 1991
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