Transmission electron microscopy studies of growth and...

Transmission electron microscopy studies of growth and interface structure of chemically vapour deposited TiC and TiN films on WCCo alloy subsrates

J. Echigoya, Zheng-Tang Liu, A. Imamura, S. Takatsu
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Volume:
198
Year:
1991
Language:
english
Pages:
8
DOI:
10.1016/0040-6090(91)90347-z
File:
PDF, 658 KB
english, 1991
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