Electrical characterization of SiGe heterostructure...

Thin Solid Films 1992 Vol. 222; Iss. 1-2

Electrical characterization of SiGe heterostructure bipolar transistors

J. Engvall, V. Nagesh, H.G. Grimmeiss, H.-U. Schreiber, E. Kasper
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Volume:
222
Year:
1992
Language:
english
Pages:
3
DOI:
10.1016/0040-6090(92)90058-j
File:
PDF, 236 KB
english, 1992
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