Characterization of short-period Sim Gen superlattices by high-resolution transmission electron microscopy and X-ray diffraction
W. Jäger, D. Stenkamp, P. Ehrhart, K. Leifer, W. Sybertz, H. Kibbel, H. Presting, E. KasperVolume:
222
Year:
1992
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(92)90073-k
File:
PDF, 992 KB
english, 1992