Auger electron spectroscopy composition depth profiling of...

Auger electron spectroscopy composition depth profiling of Cr/Ni multilayer structures using Ar+ and Xe+ ions

J. Liday, R. Harman, G. Badin, J. Breza, A. Zalar
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Volume:
208
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(92)90659-y
File:
PDF, 485 KB
english, 1992
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