Cross-sectional transmission electron microscopy of thin...

Cross-sectional transmission electron microscopy of thin film polycrystalline semiconductors by conventional microtomy

Ana Albu-Yaron, Andre Frank, Gary Hodes, Rommel Noufi
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Volume:
227
Year:
1993
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(93)90181-n
File:
PDF, 924 KB
english, 1993
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