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Characterization of radiative surface modes and anisotropy in Ag/SiO2 multilayers, by visible and IR ellipsometry
A. Bichri, O. Hunderi, J. Lafait, E. WoldVolume:
234
Year:
1993
Language:
english
Pages:
4
DOI:
10.1016/0040-6090(93)90316-h
File:
PDF, 349 KB
english, 1993