Structural characterization of yttria (Y2O3) inclusions in YBa2Cu3O7−x films: Growth model and effect on critical current density
T.I. Selinder, U. Helmersson, Z. Han, L.R. WallenbergVolume:
229
Year:
1993
Language:
english
Pages:
12
DOI:
10.1016/0040-6090(93)90371-u
File:
PDF, 3.96 MB
english, 1993