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Fourier transform IR monitoring of porous silicon passivation during post-treatments such as anodic oxidation and contact with organic solvents
M.A. Hory, R. Hérino, M. Ligeon, F. Muller, F. Gaspard, I. Mihalcescu, J.C. VialVolume:
255
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0040-6090(94)05654-v
File:
PDF, 429 KB
english, 1995