![](/img/cover-not-exists.png)
The use of infrared interference spectra to measure ceramic coating thickness in a CVD reactor
Terence J. Clark, Mark A. Banash, Richard W. Cruse, John Fech, Robert M. Mininni, Stephen J. RohmanVolume:
254
Year:
1995
Language:
english
Pages:
3
DOI:
10.1016/0040-6090(94)06269-2
File:
PDF, 313 KB
english, 1995