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Scanning tunneling microscopy study on YBa2Cu3O7−x films with growth stop by observing reflection high-energy electron diffraction oscillations
Hirata, K., Baudenbacher, F., Lang, H.P., Güntherodt, H.-J., Kinder, H.Volume:
195
Year:
1993
Language:
english
DOI:
10.1016/0925-8388(93)90697-L
File:
PDF, 421 KB
english, 1993