X-ray photoelectron spectroscopy characterization of...

X-ray photoelectron spectroscopy characterization of amorphous molybdenum oxysulfide thin films

L. Benoist, D. Gonbeau, G. Pfister-Guillouzo, E. Schmidt, G. Meunier, A. Levasseur
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Volume:
258
Year:
1995
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(94)06383-4
File:
PDF, 508 KB
english, 1995
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