X-ray photoelectron spectroscopy characterization of amorphous molybdenum oxysulfide thin films
L. Benoist, D. Gonbeau, G. Pfister-Guillouzo, E. Schmidt, G. Meunier, A. LevasseurVolume:
258
Year:
1995
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(94)06383-4
File:
PDF, 508 KB
english, 1995