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Observation of molecular reorientations in vapor-deposited organic thin films during heat treatment by energy-dispersive total-reflection X-ray diffractometry
Kouichi Hayashi, Kenji Ishida, Toshihisa Horiuchi, Kazumi MatsushigeVolume:
245
Year:
1994
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(94)90875-3
File:
PDF, 530 KB
english, 1994