Quantitative study by atomic force microscopy and spectrophotometry of the roughness and brightness of electrodeposited nickel in the presence of additives
V. Darrort, M. Troyon, J. Ebothé, C. Bissieux, C. NicollinVolume:
265
Year:
1995
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(95)06616-0
File:
PDF, 703 KB
english, 1995