Depth profiling of thin ITO films by grazing incidence...

Thin Solid Films 1996 Vol. 278; Iss. 1-2

Depth profiling of thin ITO films by grazing incidence X-ray diffraction

D.G. Neerinck, T.J. Vink
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Volume:
278
Year:
1996
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(95)08117-8
File:
PDF, 726 KB
english, 1996
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