XPS and X-ray diffraction studies of aluminum-doped zinc...

Thin Solid Films 1996 Vol. 280; Iss. 1-2

XPS and X-ray diffraction studies of aluminum-doped zinc oxide transparent conducting films

Md Nurul Islam, T.B. Ghosh, K.L. Chopra, H.N. Acharya
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Volume:
280
Year:
1996
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(95)08239-5
File:
PDF, 758 KB
english, 1996
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