Xenon migration in UO2 under irradiation studied by SIMS...

Journal of Nuclear Materials 2013 / 9 Vol. 440; Iss. 1-3

Xenon migration in UO2 under irradiation studied by SIMS profilometry

Marchand, B., Moncoffre, N., Pipon, Y., Bérerd, N., Garnier, C., Raimbault, L., Sainsot, P., Epicier, T., Delafoy, C., Fraczkiewicz, M., Gaillard, C., Toulhoat, N., Perrat-Mabilon, A., Peaucelle, C.
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Volume:
440
Language:
english
Journal:
Journal of Nuclear Materials
DOI:
10.1016/j.jnucmat.2013.04.005
Date:
September, 2013
File:
PDF, 1.70 MB
english, 2013
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