The complete flux scheme—Error analysis and application to plasma simulation
Liu, L., van Dijk, J., ten Thije Boonkkamp, J.H.M., Mihailova, D.B., van der Mullen, J.J.A.M.Volume:
250
Language:
english
Journal:
Journal of Computational and Applied Mathematics
DOI:
10.1016/j.cam.2013.03.011
Date:
October, 2013
File:
PDF, 608 KB
english, 2013