Influence of annealing on reverse current of 4H–SiC Schottky diodes
Sochacki, Mariusz, Szmidt, Jan, Bakowski, Mietek, Werbowy, AleksanderVolume:
11
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(01)00580-5
Date:
March, 2002
File:
PDF, 127 KB
english, 2002