Structural and dielectric properties of Ba(X1/3Ta2/3)O3 thin films grown by RF-PLD
Nedelcu, L., Scarisoreanu, N.D., Chirila, C., Busuioc, C., Banciu, M.G., Jinga, S.I., Dinescu, M.Volume:
278
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2012.10.124
Date:
August, 2013
File:
PDF, 725 KB
english, 2013