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Ranking TEM cameras by their response to electron shot noise
Grob, Patricia, Bean, Derek, Typke, Dieter, Li, Xueming, Nogales, Eva, Glaeser, Robert M.Volume:
133
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2013.01.003
Date:
October, 2013
File:
PDF, 425 KB
english, 2013