Atomic Force Microscopy as a Valuable Tool in an Innovative Multi-scale and Multi-technique Non-invasive Approach to Surface Cleaning Monitoring
Pereira, C., Ferreira, I.M.P.L.V.O., Branco, L.C., Sandu, I.C.A., Busani, T.Volume:
8
Year:
2013
Language:
english
Journal:
Procedia Chemistry
DOI:
10.1016/j.proche.2013.03.032
File:
PDF, 1.55 MB
english, 2013