Temperature-dependent investigation of low frequency noise...

Solid-State Electronics 2013 / 11 Vol. 89

Temperature-dependent investigation of low frequency noise characteristics of mesa-, fin-, and island-isolated AlGaN/GaN HFETs

Manouchehri, Farzin, Valizadeh, Pouya, Kabir, M.Z.
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Volume:
89
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2013.06.009
Date:
November, 2013
File:
PDF, 4.24 MB
english, 2013
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