RTN and BTI in nanoscale MOSFETs: A comprehensive...

Solid-State Electronics 2013 / 6 Vol. 84

RTN and BTI in nanoscale MOSFETs: A comprehensive statistical simulation study

Amoroso, Salvatore Maria, Gerrer, Louis, Markov, Stanislav, Adamu-Lema, Fikru, Asenov, Asen
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Volume:
84
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2013.02.016
Date:
June, 2013
File:
PDF, 2.34 MB
english, 2013
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