In situ atomic force microscopic observation of growth of...

In situ atomic force microscopic observation of growth of islands of organic contaminants on an H?Si(111) surface

FUKUDA, A
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Volume:
230
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/S0169-4332(04)00203-X
Date:
May, 2004
File:
PDF, 330 KB
english, 2004
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