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Local structural analysis of a-SiCx:H films formed by decomposition of tetramethylsilane in microwave discharge flow of Ar
Wada, Akira, Ogaki, Takeshi, Niibe, Masahito, Tagawa, Masahito, Saitoh, Hidetoshi, Kanda, Kazuhiro, Ito, HaruhikoVolume:
20
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/j.diamond.2011.01.020
Date:
March, 2011
File:
PDF, 477 KB
english, 2011