Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells
Yankang, Du, Shuming, Chen, Biwei, LiuVolume:
44
Language:
english
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2012.11.011
Date:
February, 2013
File:
PDF, 518 KB
english, 2013