Effect of high current density on the admittance response...

Solid-State Electronics 2013 / 2 Vol. 80

Effect of high current density on the admittance response of interface states in ultrathin MIS tunnel junctions

Godet, Christian, Fadjie-Djomkam, Alain-Bruno, Ababou-Girard, Soraya
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
80
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2012.10.012
Date:
February, 2013
File:
PDF, 898 KB
english, 2013
Conversion to is in progress
Conversion to is failed