New parameter extraction method based on split C–V...

Solid-State Electronics 2013 / 6 Vol. 84

New parameter extraction method based on split C–V measurements in FDSOI MOSFETs

Ben Akkez, Imed, Cros, Antoine, Fenouillet-Beranger, Claire, Boeuf, Frederic, Rafhay, Q., Balestra, Francis, Ghibaudo, Gérard
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Volume:
84
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2013.02.011
Date:
June, 2013
File:
PDF, 502 KB
english, 2013
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