Investigation of ultrathin DLC film growth by a novel X-ray...

Diamond and Related Materials 1999 / 3 Vol. 8; Iss. 2-5

Investigation of ultrathin DLC film growth by a novel X-ray reflectivity technique and in situ ellipsometry

Kondrashov, P.E., Smirnov, I.S., Lukashov, Y.E., Yablokov, S.Yu., Baranov, A.M., Dowling, D.P., Donnelly, K., Flood, R.V., McConnell, M.L.
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Volume:
8
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(98)00405-1
Date:
March, 1999
File:
PDF, 171 KB
english, 1999
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