ESD characterization of a 190V LIGBT SOI ESD power clamp structure for plasma display panel applications
Jiang, Lingli, Fan, Hang, Qiao, Ming, Zhang, Bo, Li, ZhaojiVolume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.02.002
Date:
May, 2013
File:
PDF, 2.00 MB
english, 2013