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Unexpected impact of germanium content in SiGe bulk PMOSFETs
Diouf, C., Cros, A., Soussou, A., Rideau, D., Haendler, S., Rosa, J., Ghibaudo, G.Volume:
86
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2013.04.024
Date:
August, 2013
File:
PDF, 2.13 MB
english, 2013