Gauging contact line friction of droplets: In situ...

Microelectronic Engineering 2012 / 10 Vol. 98

Gauging contact line friction of droplets: In situ measurement within a digital microsystem

Theisen, Johannes, Davoust, Laurent
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Volume:
98
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2012.06.018
Date:
October, 2012
File:
PDF, 520 KB
english, 2012
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