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The use of ion scattering for the study of radiation damage in metals and semiconductors: I. High energy scattering studies. II. Low energy scattering studies of ion bombardment induced surface damage
DG ArmourVolume:
32
Year:
1982
Language:
english
DOI:
10.1016/0042-207x(82)93789-7
File:
PDF, 62 KB
english, 1982