Field-dependent charge trapping analysis of ONO inter-poly...

Solid-State Electronics 2014 / 04 Vol. 94

Field-dependent charge trapping analysis of ONO inter-poly dielectrics for NAND flash memory applications

Moon, Pyung, Lim, Jun Yeong, Youn, Tae-Un, Park, Sung-Kye, Yun, Ilgu
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Volume:
94
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2014.02.007
Date:
April, 2014
File:
PDF, 1.34 MB
english, 2014
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