Characterization of interface states in thin films of thermally grown SiO2
F Campabadal, X Aymerich-Humet, F Serra-MestresVolume:
34
Year:
1984
Language:
english
Pages:
3
DOI:
10.1016/0042-207x(84)90187-8
File:
PDF, 292 KB
english, 1984