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Electron paramagnetic resonance of defects in doped microcrystalline silicon
M Lavado, R Martins, I Ferreira, G Lavareda, E Fortunato, M Vieira, L GuimarãesVolume:
39
Year:
1989
Language:
english
Pages:
4
DOI:
10.1016/0042-207x(89)90039-0
File:
PDF, 289 KB
english, 1989