Characterization of radiation damage by ellipsometry and...

Vacuum 1989 Vol. 39; Iss. 2-4

Characterization of radiation damage by ellipsometry and channeling

Zhang Shuzhi, Wei Ai-jian, Tan Chun-yu, Xia Yue-yuan, Lei Zhen-huan, Zhang Zhaolin, Wang Yihua, Chen Lu, Liu Jia-rui, Zheng Zong-shuang, Zhu Pei-ran
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Volume:
39
Year:
1989
Language:
english
Pages:
3
DOI:
10.1016/0042-207x(89)90183-8
File:
PDF, 273 KB
english, 1989
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