Correlation between electrical and microscopic properties...

Correlation between electrical and microscopic properties of TiSi interfaces

X Wallart, J.P Nys, H.S Zeng, G Dalmai
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
41
Year:
1990
Language:
english
Pages:
3
DOI:
10.1016/0042-207x(90)93855-d
File:
PDF, 271 KB
english, 1990
Conversion to is in progress
Conversion to is failed