On the use of H+ and Ar+ ions for high spatial resolution...

On the use of H+ and Ar+ ions for high spatial resolution depth profiling

J. Verhoeven, H. Zeijlemaker, E.J. Puik, M.J. van der Wiel
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Volume:
41
Year:
1990
Language:
english
Pages:
3
DOI:
10.1016/0042-207x(90)93948-i
File:
PDF, 234 KB
english, 1990
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