XPS and EELS study of the valence band electronic structure...

XPS and EELS study of the valence band electronic structure of TiN and (Ti, Al)N coatings as influenced by the deposition parameters

I.leR. Strydom, S. Hofmann
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Volume:
41
Year:
1990
Language:
english
Pages:
5
DOI:
10.1016/0042-207x(90)94035-o
File:
PDF, 377 KB
english, 1990
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