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XPS and EELS study of the valence band electronic structure of TiN and (Ti, Al)N coatings as influenced by the deposition parameters
I.leR. Strydom, S. HofmannVolume:
41
Year:
1990
Language:
english
Pages:
5
DOI:
10.1016/0042-207x(90)94035-o
File:
PDF, 377 KB
english, 1990