In situ structural characterization of picene thin films by...

Chemical Physics Letters 2012 / 08 Vol. 544

In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O

Hosokai, T., Hinderhofer, A., Vorobiev, A., Lorch, C., Watanabe, T., Koganezawa, T., Gerlach, A., Yoshimoto, N., Kubozono, Y., Schreiber, F.
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Volume:
544
Language:
english
Journal:
Chemical Physics Letters
DOI:
10.1016/j.cplett.2012.07.006
Date:
August, 2012
File:
PDF, 388 KB
english, 2012
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