Evaluation of thin metal film thickness from light...

Thin Solid Films 2013 / 06 Vol. 536

Evaluation of thin metal film thickness from light attenuation and multi-reflection effects on micro-Raman response

Camerlingo, C., Lisitskiy, M.P., De Stefano, L., Rea, I., Delfino, I., Lepore, M.
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Volume:
536
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2013.04.007
Date:
June, 2013
File:
PDF, 490 KB
english, 2013
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