The Effects of Interfacial SiO2 on Pd2Si Formation
Scott, D.M., Lau, S.S., Pfeffer, R.L., Lux, R.A., Mikkelson, J., Wieluński, L., Nicolet, M.-A.Volume:
104
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/S0040-6090(83)80001-7
Date:
June, 1983
File:
PDF, 3.90 MB
english, 1983