An EPR study at X- and W-band of defects in a-C:H films in...

An EPR study at X- and W-band of defects in a-C:H films in the temperature range 5–300 K

Jones, B.J., Barklie, R.C., Smith, G., El Mkami, H., Carey, J.D., Silva, S.R.P.
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Volume:
12
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(03)00012-8
Date:
February, 2003
File:
PDF, 177 KB
english, 2003
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