Passivation of interface traps in MOS-devices on n- and...

Diamond and Related Materials 1997 / 8 Vol. 6; Iss. 10

Passivation of interface traps in MOS-devices on n- and p-type 6H-SiC

Stein von Kamienski, E.G., Leonhard, C., Scharnholz, S., Gölz, A., Kurz, H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
6
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(97)00049-6
Date:
August, 1997
File:
PDF, 452 KB
english, 1997
Conversion to is in progress
Conversion to is failed